Plateforme de Caractérisation des Matériaux
**Veuillez noter que la Plateforme de Caractérisation des Matériaux est maintenant située à CAMaR**
Microscopy Facility
JEM-2100F FETEM (JEOL)
- Field Emission Gun
- Acceleration Voltage: 200kV (80, 100, 120kV)
- TEM (0.19nm point-to point resolution)
- HRTEM (0.1 nm lattice image)
- STEM (0.2 nm resolution)
- Electron Diffraction
- Selected area electron diffraction
- Nano-beam electron diffraction
- Convergence beam electron diffraction
- Energy Dispersive X-ray Spectroscopy (EDS)
- elemental analysis and mapping
- Electron Energy Loss Spectroscopy (EELS)
- EFTEM
- EELS spectrum imaging
- EELS/EDS imaging
Fee Structure
- Please contact us for consultation and fees
Contact
Yun Liu, Materials Characterization Facility Manager
Telephone: (613) 562-5800, ext. 6786
yli5@uottawa.ca

FEI Tecnai G2 Spirit Twin TEM
- Acceleration voltage: 20 – 120kV (Lab6 emitter)
- High resolution and high contrast imaging for biological and soft materials
- Cryo-electron microscopy
- Electron tomography
- Integrated Fluorescent Microscopy and Electron Microscopy (iCorr)
Contact
Yun Liu
Tel. 613-562-5800 extension 6786
E-mail: yli5@uottawa.ca

JSM-7500F FESEM (JEOL)
- Field Emission Gun
- Acceleration Voltage: 0-30 kV
- Secondary Electron Imaging
- 1.4 nm (at 1 kV)
- 1 nm (at 15 kV))
- Low voltage STEM
- 1nm (at 30 kV)
- Backscattered Electron Imaging (Z-contrast)
- Energy Dispersive X-ray Spectroscopy (EDS)
- Electron Backscatter Diffraction (EBSD)
Fee Structure
- Please contact us for consultation and fees
Contact
Yun Liu, Materials Characterization Facility Manager
Telephone: (613) 562-5800, ext. 6786
yli5@uottawa.ca

HORIBA XploRATM Plus Raman Microscope
- Two-laserwavelengths Raman spectroscopy
- Small area Raman analysis with Optical microscope at 10x and 100x magnifications
- High resolution Raman imaging
- Couples with AIST-NT OmegaScopeTM 1000 for TERS(Tip Enhanced Raman Spectroscopy)
AIST-NT OmegaScopeTM 1000
- Atomic Force Microscopy in contact mode and tapping mode
- Kevin probe microscopy
- Couples with HORIBA XploRaTM Plus Raman microscopefor TERS(Tip Enhanced Raman Spectroscopy)
Contact
Yun Liu
Tel. 613-562-5800 extension 6786
E-mail: yli5@uottawa.ca
Sample Preparation Equipment
- Precision Etching and Coating System (Gatan Model 882 PECS)
PECS is a bench-top ion beam based etching and coating system, designed to etch and/or sputter-coat specimens for both SEM and TEM applications. - Ultramicrotome (Leica Ultracut UC6)
Section thickness: 1 nm – 15 µm (with a diamond knife) - Turbo Pumping Station (Varian V-81M Turbo Station)
Vacuum : 10-8 Torr (for pre-pumping TEM and SEM specimens) - Ultra-centrifuge (Lengend RT)
Rotor type | Capacity | Max. speed |
Swing bucket | 4 x 750 ml | 4150 rpm |
F14-6x250LE | 4 x 250 ml | 10,000 rpm |
F21-48x2 | 48 x 2 ml | 15,000 rpm |
- Furnace (CARBOLITE)
Maximum Temperature: 1700 oC - Vacuum oven (Lindburg-Blue M)
Maximum Temperature: 260 oC
Fee structure
- Please contact us for consultation and fees
Contact
Yun Liu, Materials Characterization Facility Manager
Telephone: (613) 562-5800, ext. 6786
yli5@uottawa.ca