Plateforme de Caractérisation des Matériaux

**Veuillez noter que la Plateforme de Caractérisation des Matériaux est maintenant située à CAMaR**

Microscopy Facility

JEM-2100F FETEM (JEOL)

• Field Emission Gun
• Acceleration Voltage: 200kV (80, 100, 120kV)
• TEM (0.19nm point-to point resolution)
• HRTEM (0.1 nm lattice image)
• STEM (0.2 nm resolution)
• Electron Diffraction
  • Selected area electron diffraction
  • Nano-beam electron diffraction
  • Convergence beam electron diffraction
• Energy Dispersive X-ray Spectroscopy (EDS)
  • elemental analysis and mapping
• Electron Energy Loss Spectroscopy (EELS)
  • EFTEM
  • EELS spectrum imaging
  • EELS/EDS imaging

Fee Structure

• Please contact us for consultation and fees

Contact

Yun Liu, Materials Characterization Facility Manager
Telephone: (613) 562-5800, ext. 6786
yli5@uottawa.ca

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FEI Tecnai G2 Spirit Twin TEM

• Acceleration voltage: 20 – 120kV (Lab6 emitter)
• High resolution and high contrast imaging for biological and soft materials
• Cryo-electron microscopy
• Electron tomography
• Integrated Fluorescent Microscopy and Electron Microscopy (iCorr)

Contact

Yun Liu

Tel. 613-562-5800 extension 6786

E-mail: yli5@uottawa.ca

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JSM-7500F FESEM (JEOL)

• Field Emission Gun
• Acceleration Voltage: 0-30 kV
• Secondary Electron Imaging
  • 1.4 nm (at 1 kV)
  • 1 nm (at 15 kV))
• Low voltage STEM
  • 1nm (at 30 kV)
• Backscattered Electron Imaging (Z-contrast)
• Energy Dispersive X-ray Spectroscopy (EDS)
• Electron Backscatter Diffraction (EBSD)

Fee Structure

• Please contact us for consultation and fees

Contact

Yun Liu, Materials Characterization Facility Manager
Telephone: (613) 562-5800, ext. 6786
yli5@uottawa.ca

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HORIBA XploRA^TM Plus Raman Microscope

• Two-laserwavelengths Raman spectroscopy
• Small area Raman analysis with Optical microscope at 10x and 100x magnifications
• High resolution Raman imaging
• Couples with AIST-NT OmegaScope^TM 1000 for TERS(Tip Enhanced Raman Spectroscopy)

AIST-NT OmegaScope^TM 1000

• Atomic Force Microscopy in contact mode and tapping mode
• Kevin probe microscopy
• Couples with HORIBA XploRa^TM Plus Raman microscopefor TERS(Tip Enhanced Raman Spectroscopy)

Contact

Yun Liu

Tel. 613-562-5800 extension 6786

E-mail: yli5@uottawa.ca

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Sample Preparation Equipment

• Precision Etching and Coating System (Gatan Model 882 PECS)
  PECS is a bench-top ion beam based etching and coating system, designed to etch and/or sputter-coat specimens for both SEM and TEM applications.
• Ultramicrotome (Leica Ultracut UC6)
  Section thickness: 1 nm – 15 µm (with a diamond knife)
• Turbo Pumping Station (Varian V-81M Turbo Station)
  Vacuum : 10-8 Torr (for pre-pumping TEM and SEM specimens)
• Ultra-centrifuge (Lengend RT)

Rotor type	Capacity	Max. speed
Swing bucket	4 x 750 ml	4150 rpm
F14-6x250LE	4 x 250 ml	10,000 rpm
F21-48x2	48 x 2 ml	15,000 rpm

• Furnace (CARBOLITE)
  Maximum Temperature: 1700 oC
• Vacuum oven (Lindburg-Blue M)
  Maximum Temperature: 260 oC

Fee structure

• Please contact us for consultation and fees

Contact

Yun Liu, Materials Characterization Facility Manager
Telephone: (613) 562-5800, ext. 6786
yli5@uottawa.ca