Surface Analysis Facility

Explore the Surface Analysis Facility!

Kratos analytical axis ultra DLD

Capabilities

  • Quantitative elemental compositions as well as chemical state information of surfaces
  • Non-destructive and destructive depth profiling using ion etching
  • Elemental and chemical mapping and small spot analysis.
  • Study surface reaction mechanisms with the reaction cell attached to the XPS instrument.
Axe analytique Kratos ultra DLD

XPS

Fee structure

  • Fees for usage of CCRI resources are posted in the CCRI Annual Report

Contact us

Surface Analysis Facility

Alexander Mommers
XPS Spectrometer and Surface Analysis Facility Operator
Telephone: (613) 562-5800, ext. 6045
[email protected]