Ellipsometer – Horiba UVISEL FUV-NIR


The UVISEL scanning spectroscopic ellipsometer covers a range from FUV to NIR (255 to 2100 nanometers in wavelength) for thin film characterizations

This includes thin to thick layers, with or without a transparent substrate, in the fields of semiconductors, flat panel displays, optoelectronics, photovoltaics, and optical and functional coatings

Download the Ellipsometer – Horiba UVISEL FUV-NIR Brochure (PDF version, 2,014 KB)

Image of an Ellipsometer