• The DektakXT is a profilometer used for measuring step heights or trench depths on a surface. The display range of the data is 200 A to 655,000 A (65.5 um) with a vertical resolution of ~ 5 A.
  • This stylus surface profiler provides repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analysis.
  • There are several methods of application, such as surface roughness verification, thin film inspection, solar trace analysis, and microfluids.

Download the Profiler – Bruker DektakXT Brochure (PDF version, 2.1 MB)

Image of the DektakXT Profiler