The AFM Park NX10 is an accurate atomic force microscope for nanotechnology.

The material characterization techniques of this tool include:

  • Non-contact AFM
  • Contact AFM
  • Lateral force microscopy (LFM)
  • Phase imaging
  • Intermittent tapping
  • Conductive AFM
  • I-V spectroscopy
  • Scanning Kelvin probe microscopy (SKPM)
  • Electrostatic force microscopy (EFM) including dynamic contact (DC-EFM) and piezoresponse force microscopy (PFM)

Download the AFM Park NX10 Brochure (PDF version, 1,242 KB)

Image of the AFM Park NX10